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Scientific Committee

Committee Members

Zhiguo Wang

University of Electronic Science and Technology of China

Udo Netzelmann

Fraunhofer-Institute for Nondestructive Testing, Germany

Robert Cousins

University of California Los Angeles, USA

Peter Littlewood

University of Chicago, USA

Josep Nogues

Catalan Institute of Nanoscience and Nanotechnology, Spain

Dapeng Yu

Southern University of Science and Technology, China